ZDS M2A1920-40UM
| Parameter | Value |
|---|---|
| Resolution | 1920x1200 |
| Sensor | Sony IMX249 |
| BIN | - |
| SUM | 960x600 40FPS |
| Minimum ROI | 40x40, Minimum Step 8 |
| Other Resolution | 1920x1080 1080P 44FPS |
| Optical Sensor | 1/1.2" |
| Shutter Technology | Global |
| Pixel Size | 5.86um |
| Max Frame Rate | 40FPS |
| Mono/Color | Mono |
| Resolution | 1920x1200 |
| Sensor Size | 11.25mmx7.032mm |
| SNR | 43.64db |
| Sensibility | 0.825V/Lux.S 1/30S |
| Bit Depth | 12bit |
| Trigger | Software/Hardware Trigger |
| Dynamic Range | 59db |
| Spectral | 390nm-1050nm |
| Exposure Time | 20us-20s970ms880us |
| Gain Range | Gain:1-100Times - Step Size:0.125Times |
| Image Format | MONO8, MONO16, RAW8, RAW16 |
| Photo Support Format | RAW BMP JPEG PNG |
| Power Supply | USB 5V |
| Power Consumption | Work:1.67W- Standby:1.1W |
| Interface | USB3.0 |
| Dimention | 29mm×29mm×29mm |
| Work Temperature | -10℃ - 50℃ |
| Weight | 40g |
| Lens Mount | C |
| IP Protection | IP30 |
| Compatibility | USB3.0 Vision, GenlCam, HALCON, LabView, OpenCV |
| Certification | CE, FCC, RoHS |
Sony IMX249 Monochrome Architecture: Maximum Quantum Efficiency and Spatial Precision
At the core of the ZDS M2A1920-40UM is the monochrome variant of Sony’s Pregius IMX249 CMOS sensor. In a monochrome camera, there is no color filter array (CFA) dye mask (such as a Bayer pattern) placed over the photodiode array. Every single pixel receives 100% of the incoming light across the entire visible and near-infrared (NIR) spectrum.
Key Advantages of the Monochrome Sensor Configuration:
Higher Quantum Efficiency (QE): Without the attenuation caused by red, green, and blue micro-filters, the monochrome sensor captures significantly more photons per exposure unit, making it ideal for high-speed strobing or low-light industrial environments.
Pixel-for-Pixel Spatial Accuracy: Color cameras require spatial interpolation (debayering) to calculate missing RGB values for each pixel, which inherently introduces edge-smoothing artifacts. The M2A1920-40UM provides true, un-interpolated raw grayscale intensity at every single pixel coordinate, essential for sub-pixel dimensional measurement.
Enhanced Near-Infrared (NIR) Response: The removal of color filters allows the sensor to maintain strong spectral sensitivity into the 750–950 nm NIR range, making it highly effective for penetrating semiconductor wafers, inspect solar cells, or seeing through translucent packaging.
The sensor’s large 5.86 µm × 5.86 µm pixel architecture yields a high full-well capacity, resulting in low temporal dark noise and superior signal-to-noise ratio (SNR). Combined with true Global Shutter technology, all 2,304,000 pixels trigger simultaneously, capturing fast-moving objects on production lines with zero spatial skew, distortion, or motion blur.
High-Throughput USB 3.0 Vision Interface
The M2A1920-40UM leverages the USB 3.0 SuperSpeed bus, transmitting uncompressed 8-bit, 10-bit, or 12-bit grayscale images at full 1920 × 1200 resolution at 40 frames per second.
To ensure rock-solid data integrity in electrically noisy industrial plants, the camera incorporates an industrial-grade screw-locking Micro-B USB connector. The hardware pipeline features an onboard frame buffer that holds image frames during host controller bus contention, preventing frame loss even under high system CPU loads. Being fully bus-powered (< 2.5W), the camera requires only a single cable for both data transfer and power, significantly simplifying cabling topologies on moving mechanical gantries or robotic arms.
Compact Chassis and Passive Thermal Management
Designed to fit into tight machine enclosures, the camera adopts the globally standardized 29 mm × 29 mm × 29 mm cubic form factor. Weighing just 40 grams, it reduces inertial load when mounted on high-acceleration pick-and-place heads or robotic end-effectors.
The precision-machined aluminum housing acts as a thermal conductor. By dissipating heat effectively across the entire chassis, the camera maintains a low sensor junction temperature during continuous 24/7 operation. Minimizing heat generation prevents thermal dark current noise accumulation, ensuring consistent black levels, stable dynamic range, and repeatable measurements across multi-shift production runs.
Onboard Image Signal Processing (ISP) Features
The M2A1920-40UM handles crucial image pre-processing tasks directly on its onboard FPGA, removing processing burdens from the host system:
Hardware Look-Up Tables (LUT) & Gamma Correction: Allows custom contrast curve adjustments directly on the camera to highlight subtle grayscale variations in low-contrast defects.
Region of Interest (ROI) Windowing: Selecting a smaller vertical or horizontal region on the sensor increases the readout frame rate proportionally, enabling frame rates in excess of several hundred FPS for localized tracking.
Flat Field Correction (FFC): Corrects uneven illumination profiles and lens shading in real-time, delivering a uniform grayscale background across the entire image field.
Hardware Trigger & Strobe Synchronization: Opto-isolated I/O pins support external pulse triggering with microsecond-level precision, synchronizing camera exposure perfectly with LED strobe lights and part-present sensors.
Primary Industrial Applications
While color cameras are preferred for aesthetic or hue-sorting tasks, monochrome cameras are the gold standard for high-precision machine vision tasks where contrast, speed, and geometric accuracy are paramount.
1. High-Precision Metrology and Dimensional Measurement
In precision machining, automotive stamping, and medical device manufacturing, components must be verified against tight geometric tolerances. The true pixel-for-pixel accuracy of the M2A1920-40UM allows edge-detection algorithms (e.g., Canny, Sobel) to achieve sub-pixel accuracy down to fractions of a micron, without the blur artifacts caused by color interpolation.
2. Surface Defect and Scratch Inspection
Using directional monochromatic lighting (such as low-angle blue or red LED rings), the high dynamic range of the IMX249 sensor exposes microscopic scratches, dents, micro-cracks, and surface contamination on metal, glass, plastic, or silicon wafers.
3. High-Speed Optical Character Recognition (OCR) and Code Reading
In logistics and manufacturing traceability, reading laser-etched 2D DataMatrix codes, 1FA barcodes, or inkjet-printed lot numbers requires maximum contrast between the text and the substrate. The high contrast of the monochrome stream delivers higher recognition rates for OCR/OCV software engines at high conveyor speeds.
4. Semiconductor and Solar Wafer Inspection (EL / NIR)
In the solar cell and semiconductor sectors, micro-cracks inside silicon wafers are often invisible under standard white light. When illuminated with Near-Infrared (NIR) backlights, the high NIR sensitivity of the M2A1920-40UM allows light to pass through the silicon substrate, revealing internal structural defects, wire-bond integrity, and stress cracks.
5. Vision-Guided Robotics (VGR)
For high-speed robotic bin picking and part positioning, the camera’s lightweight form factor allows direct mounting to robotic arms. The high-sensitivity monochrome sensor works reliably under varying ambient factory lighting conditions when paired with narrowband optical pass filters matching specific LED lighting wavelengths.
Software Ecosystem and Integration
The ZDS M2A1920-40UM strictly complies with the USB3 Vision and GenICam software standards. This universality guarantees instant driver recognition across all major machine vision software environments:
Commercial Vision Suites: Direct support in MVTec HALCON, Cognex VisionPro, Adaptive Vision, and NI LabVIEW.
Open Source & Custom SDKs: Seamless integration with OpenCV, MATLAB, and ROS (Robot Operating System).
ZDS Native SDK: Free, multi-platform SDK providing native C, C++, C#, and Python APIs for Windows and Linux (x86_64 and ARM architecture).
The ZDS M2A1920-40UM offers a powerful combination of high quantum efficiency, global shutter performance, true monochrome spatial accuracy, and USB 3.0 reliability, making it an essential component for demanding machine vision and automated inspection systems.

